Castro Márquez, Carlos Iván; Tobar, Edgar Leonardo Romero; Strum, Marius; Wang, Jiang Chau 
Source: Journal of Electronic Testing. Unidade: EP
Assunto: CIRCUITOS INTEGRADOS
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ABNT
CASTRO MÁRQUEZ, Carlos Iván et al. A Functional Verification Methodology Based on Parameter Domains for Efficient Input Stimuli Generation and Coverage Modeling. Journal of Electronic Testing, v. 27, n. 4, p. 485-503, 2011Tradução . . Disponível em: https://doi.org/10.1007/s10836-011-5225-8. Acesso em: 01 maio 2024.APA
Castro Márquez, C. I., Tobar, E. L. R., Strum, M., & Wang, J. C. (2011). A Functional Verification Methodology Based on Parameter Domains for Efficient Input Stimuli Generation and Coverage Modeling. Journal of Electronic Testing, 27( 4), 485-503. doi:10.1007/s10836-011-5225-8NLM
Castro Márquez CI, Tobar ELR, Strum M, Wang JC. A Functional Verification Methodology Based on Parameter Domains for Efficient Input Stimuli Generation and Coverage Modeling [Internet]. Journal of Electronic Testing. 2011 ; 27( 4): 485-503.[citado 2024 maio 01 ] Available from: https://doi.org/10.1007/s10836-011-5225-8Vancouver
Castro Márquez CI, Tobar ELR, Strum M, Wang JC. A Functional Verification Methodology Based on Parameter Domains for Efficient Input Stimuli Generation and Coverage Modeling [Internet]. Journal of Electronic Testing. 2011 ; 27( 4): 485-503.[citado 2024 maio 01 ] Available from: https://doi.org/10.1007/s10836-011-5225-8
